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Maximilian Seesslen, 01.10.2024 14:42

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h1. Wiki
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There are some issues that can only be tested via power resets.
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* SPI has an issue that it needs retries
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* Looks like configuration I2C EEPROM gets reset to defaults
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* RTC-offline-test (Wie lange haelt die RTC Batterie)
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The device has an CANBus in and an CANBus out. The testsoftware is on the DUT. The DUT sends the command to toggle power line to Awaria via CAN.
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The switch-off time has to be an parameter. The RTC-Tests will be complex, the Awaria software shall be simple and generic.
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An data multiplexer can be used along with a mosfet for power line.
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Data lines for CAN and UART have to be cut. 
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In order to cut UART, an Debug-Adapter chaining would be needed. Or Uart is available via Host-USB.
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Optionally controll it via USB from PC, not MCU. Optically isolated GPIOs.
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h1. Problem
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Circuit does not help at all when power is injected into device via Pullup of RS232. Lines can be disabled too. But whole
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debug connector can cause issues: No debug connection at all.
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FPC with UART only? All signals disconnectable?
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h1. Usecases
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* Devices have their own test-software and ask awaria to perform an power-cycle for them. Result is stored in option Bytes.
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* PC performs test. DUT has to send Log-Events when errors show up and when device is up and running. DUT firmware can be the productive firmware.
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** Tester-Firmware on PC is quite generic
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** CAN may not be available yet (CANDis). That was one intention of repeated log code
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** CANDis may be configured to use USB. No UART output here. USB does also not help then.
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* Long time tests. Device can be in a permanent reboot loop with alternating writing/reading EEPROM. Awaria can persist status and result. Cordyceps can readout values at any time.
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h2. Usecases with products
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* CANDis looses touch calibration
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* CANDis; measure RTC durability
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* CANSwitch; check I2C-EEPROM-Config reliability
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h2. Problems:
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* RTC: Cant check if there was an I2C problem or RTC was actually not valid. CI2cSlace-Class needs better status handling besides "isPresent". DeviceError or ContentError
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* Waste biwak with TDT-Specific values? Use own error code range. LogEvents support custom data types.
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h1. Parts
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* MCU: The smallest thing
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* Multiplexer:
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** MC14551BDG bis zu 1K RON: 1050
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** TS5A23166DCUR cool, 2 channels, up to 100mA, 1,8-6,5V
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** Habe:
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*** DG408LEDQ-T1-GE3; .#273;  1:8
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*** DG409LEDQ-T1-GE3; .#321;  2x 1:4
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*** ADG736; .#315; 2x1:2
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*** *RS2102XN ADG836YRMZ* Das ist er; 2x
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** MAX4760; 8 Channels; Paarweise schalten
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** TMUX1574 4xSPDT; 1 Schalter
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** PI5C3257QE; 4xSPDT; 1 Schalter; 0.229€
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* Big EEPROM, device can store test info from DUT. Maybe a second EEPROM just for costom data persisting.
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Spannungs/Strom zu umstaendlich.
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h1. RTC-Tests
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Can have a region in SPI-Flash.
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If the Settings are not ok, just have an terminal.
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The test can only be started from terminal.
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rebootTest <startTime>
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Start. 
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* Cut 2 Seconds. Time OK?
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* Cut 4 Seconds. Time OK?
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* Cut 8 Seconds. Time OK?
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When it fails, "destroy" test-config in spi flash
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h1. Connectors
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* CANBus-In
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* CANBus.Out
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* Power in, 5V, 3V
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* Power out, 5V, 3V
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* -USB PC to MCU-
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* -USB PC to DUT-
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Debug, CAN, power only?
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CAN-Geraete koennten auch standalone laufen, Testsoftware auf PC.
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2x Uart
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2x SWD
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1x Reset
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1x Boot0
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2x CAN
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(DEBUG: VDD_5VIN, GND, VDD_TGT, SWO)
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USB schalten is overkill, andere Platine.